Software Engineer at Nordson Corporation

Owned the development of calibration and certification tests for a semiconductor wafer automated inspection (AOI) system that captures 3D offset data, implementing a continuous e-stop polling motion system with integrated device communication over Bluetooth/WiFi and feature-finding algorithms in tests. Generalized model-specific manufacturing tests in C# for 3D phase profilometry sensors for PCBs, enabling reuse across sensor models and reducing certification test development time from six months to two weeks. Improved debugging skills in multithreaded applications integrating motion systems, algorithms, and sensor communications, creating diagnostic messages optimized for troubleshooting. Developed robust unit and smoke tests to ensure reliability of motion systems communicating over virtual COM ports, TCP/IP sockets, and sensor functionalities such as image capturing and processing. Partnered with manufacturing engineers to resolve bugs and incorporate user feedback, enhancing design